SFX1560 Series Capacity From 5 – 30kN

  SF1240 Series 300x225 SFX1560 Series Capacity From 5   30kN                          SF1240 Series 2 300x223 SFX1560 Series Capacity From 5   30kN

The SFX1560 Series of spring testers features a robust dual column design with two 50 mm (2.0 in) guide columns; precision, preloaded ballscrews; and rigid design for minimal frame deflection even under off-center loading. The interlocked guard prevents machine movement when guard is open improving operator safety.

Range of Models

SFX1565

  • 5 kN (1125 lbf)

SF1566

  • 10 kN (2250 lbf)

SF1567

  • 30 kN (6750 lbf)
  • Main load cells available from 1 kN (225 lbf) to 30 kN (6750 lbf)
  • Systems equipped with standard accessories needed to perform compression testing on a wide variety of springs
  • Load cells mechanically and electronically protected from overload, minimizes the chance of cell damage
  • Length accuracy of ± 0.01 mm or 0.05% of displacement (whichever is greater)
  • Height errors due to machine and load cell deflection are automatically corrected by the system electronics
  • Crosshead speeds up to 1,000 mm/min (40 in/minute) for fast testing
  • 24-bit transducer resolution eliminates the need for multi-range load cell systems which can cause data transients at crossover points
  • Automatic recognition and calibration of load and position tranducers
Features and Benefits
  • Main load cells available from 1 kN (225 lbf) to 30 kN (6750 lbf)
  • Systems equipped with standard accessories needed to perform compression testing on a wide variety of springs
  • Load cells mechanically and electronically protected from overload, minimizes the chance of cell damage
  • Length accuracy of ± 0.01 mm or 0.05% of displacement (whichever is greater)
  • Height errors due to machine and load cell deflection are automatically corrected by the system electronics
  • Crosshead speeds up to 1,000 mm/min (40 in/minute) for fast testing
  • 24-bit transducer resolution eliminates the need for multi-range load cell systems which can cause data transients at crossover points
  • Automatic recognition and calibration of load and position transducers
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